BeamMap2 Scanning Slit Beam Profilers

Brand：Dataray
Model : BeamMap2

Robust Multi-Plane Beam Analysis

  • Real-time M², divergence, pointing, and focus measurements
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Multiple detector options covering 190 to 2500 nm:

  • 190 to 1150 nm: Silicon detector
  • 650 to 1800 nm: InGaAs detector
  • 1800 to 2300/2500 nm: InGaAs (extended) detector
  • ISO-compliant beam diameter measurement
  • USB 2.0 port-powered
  • Automatic gain function
  • Optional stage accessories for ISO 11146-compliant M² measurement
  • True2D™ slit with 0.1 µm resolution
  • 5 Hz update rate (adjustable range: 2 to 10 Hz)
  • Profile continuous wave/quasi-continuous wave beams
  • Beam diameter: 5 µm to 4 mm
  • Multi-z plane scanning
  • XYZ profiling with θ-Φ
  • Focus position and diameter
  • Real-time M², pointing, and divergence measurements
  • Locate focus with ±1 µm repeatability (beam dependent)

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