Brand:Multi-Field
Supports thermal expansion (ΔL vs T) & magnetostriction (ΔL vs H) measurements;
High-precision capacitor position sensing;
Available in magnetic fields ranging from 1.5 to 300 K and up to 18 Tesla;
Compatible with various low-temperature measurement platforms: MultiFields® ColdTUBE, Nanjing Pengli ®, Oxford@ TeslatronPT, QD® PPMS, Cryogenics®, and others.
High-precision capacitor position sensing;
Available in magnetic fields ranging from 1.5 to 300 K and up to 18 Tesla;
Compatible with various low-temperature measurement platforms: MultiFields® ColdTUBE, Nanjing Pengli ®, Oxford@ TeslatronPT, QD® PPMS, Cryogenics®, and others.
| Parameter Category | Parameter Item | Specification |
|---|---|---|
| 01. System Operating Environment | Sample Rod Operating Conditions | 1.5 ~ 300 K, Max. 18 T |
| Compatible Platforms | Compatible with Oxford TeslatronPT, PPMS, Cryogenics and other third-party cryogenic systems | |
| 02. Technical Parameters | Test Functions | Thermal Expansion (ΔL vs T) & Magnetostriction (ΔL vs H) |
| Applicable Sample Dimensions | Thickness L: 0.1 mm ~ 6 mm | |
| Measurement Method | High-precision capacitive position sensing | |
| Measurement Resolution |
0.05 nm (with AH Series Capacitance Bridge)
|
|
| Measurement Range | ΔL: -0.1 ~ 0.1 mm | |
| Magnetic Field Direction Configuration | H // ΔL and H ⊥ ΔL (magnetic field parallel/perpendicular to sample expansion direction) | |
| Background Subtraction | Subtracted via oxygen-free copper standard sample | |
| Sample Mounting Method | All-mechanical fixing, no adhesive required | |
| Optional Upgrade | Electrostriction test option |
