X-Ray Beam Profiler

Brand：Star Tech

Model : uBIP-25

Q'ty :

uBIP-25 Beam Profiler (1 nm–200 nm)

The µBIP series is STI's latest imaging system designed specifically for soft X-rays [1–200 nm].

Not suitable for high-power, long-wavelength lasers such as 193 nm or 248 nm excimer lasers, which may cause severe internal damage.

Most importantly, this system is designed for high-vacuum chambers, using a custom vacuum flange assembly to connect the optical system to the chamber. The flange is rated for 10⁻¹⁰ Torr.

Specifications:

FoV:11.5mm 2 with 7.5x

Microscope Objective Wavelength:1.0 - 200 nm other wavelengths and designs available to 405 nm Resolution:(0.6 µm)

Magnification:7.5x/ 10x OAL:16.25-16.95”

Vacuum Flange:2.75” diam.

With a 2.312” hole pattern Values calculated using 1” sensor.

Actual values will be determined by the pixel size and overall size of the camera sensor.

Measurements were taken with sensor-2048 x 2048, 11.3 x 11.3 mm, 5.5 μm pixel, 4.2 Mega pixel camera.

Features	Description
Focus	Adjustable ± 0.35 in
Image Rotation	Rotational adjustment about the optical axis for alignment with camera sensor
Iris Diaphragm	Adjustable from fully closed to wide open
Camera Mount	Standard c-mount
Vacuum Flanges	Conflat® copper vacuum flange, 2.75 in, 304 SS, suitable for <10⁻¹⁰ Torr