Brand：Star Tech
Model :
XUV-18 / XUV-25
| Detector Model | XUV-18/25 |
|---|---|
| Aperture | 18, 25, 35 mm (standard; other sizes on request) |
| Wavelength Range | 1–200 nm (see chart) |
| Input | 1 nA to 9 mA peak |
| Analog Output | 0.05–5 VDC |
| Dimensions |
XUV-18: 2.5 x 1.0 in XUV-25: 2.73 x 2.0 in |
| MODEL | Aperture mm | Energy | Power | Wavelengths |
|---|---|---|---|---|
| XUV - 18C - VAC | 18 | Yes | Yes | 1 nm - 200 nm |
| μXUV - 16 - VAC | 16 | Yes | Yes | 1 nm - 200 nm |
| XUV - 25 | 25 | Yes | Yes | 1 nm - 200 nm |
| VHR - 25 | 25 | Yes | Yes | 157 - 410 nm |
| VHR - 38 | 38 | Yes | Yes | 157 - 410 nm |
| VHR - 50 | 50 | Yes | Yes | 157 - 410 nm |
| VHR - 89 | 89 | Yes | Yes | 157 - 410 nm |
| XR - 10 | 10 | Yes | Yes | 157 - 410 nm |
| XR - 16 | 16 | Yes | Yes | 157 - 410 nm |
| XR - 20 | 20 | Yes | Yes | 157 - 410 nm |
| XR - 25 | 25 | Yes | Yes | 157 - 410 nm |
| XHR - 16 mini - probe | 16 | Yes | Yes | 157 - 410 nm |
| XR - 16R - 10 | 16 | Yes | Yes | 157 - 410 nm |
| BEM - 25 | 25 | Yes | Yes | 157 - 410 nm |
| BEM - 38 | 38 | Yes | Yes | 157 - 410 nm |
| BEM - 50 | 50 | Yes | Yes | 157 - 410 nm |
- NIST Traceable (5nm to 200 nm)
- High Transmission
- No Microphonics
- Low Noise
- Minimal Long-term Drift
- Polarization Insensitive
- High Damage Threshold to 500 mJ/cm2
- Full Range of Input Apertures
- Wide Wavelength Range 1 nm to 200 nm*
- Extremely Linear
- Wide Field of View
- 1 Billion + Pulses