Desktop Ellipsometer

Brand：Photonic Lattice
Model : SE-101
High-speed measurement

  • Capable of real-time measurement at intervals as fast as approximately 1/70 second. Effective for time-varying analysis of film thickness.
  • Real-time measurement speed up to 70fps, enabling instant observation of film thickness gradients.

Highly expandable

  • The main unit can be disassembled and used as a module.
Model SE-101
Measurement Method PCA (Parallel Processing Method for Photonic Crystal Array)
Film Thickness: 0.1nm, Refractive Index: 0.001*
Measurement Repeatability Thickness: 0.1nm, Refractive Index: 0.001
Light Source Semiconductor Laser (Typical value: 636nm)
Measurement Spot Size Approximately 1.0 mm²
Angle of Incidence Standard 70 degrees
Stage Size Maximum Sample Diameter: 4 inches
Measurement Speed 0.1 seconds / 1 point measurement
Product Contents Complete system software (installation CD), standard samples, instruction manual
Notes *Standard deviation value when measuring one point on a SiO₂ film on Si (approximately 100 nm thick) 100 times.
*Specifications are subject to change without prior notice.
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